What you will learn in the SEMiCS course
Holistic analysis of complex technical systems Integration of software and hardware perspectives Application of informatics methods in hightech production environments Understanding semiconductor processes and manufacturing technologies Independent structuring and solution of complex engineering t
Why you should study SEMiCS on the Zweibrücken campus
SEMiCS is a specialized master's program for computer scientists who want to expand their skills in semiconductor technology, manufacturing and systems integration.
The program combines:
Engineering Basics for Computer Scientists Semiconductor Technology & Microfabrication Embedde
Participation in the meetings
The committees usually meet in public, so you are welcome to attend the meetings by registering in advance by emailing sektretariat.hochschulleitung@hs-kl.de .
Senate protocols
The minutes of the Senate meetings since summer semester 2012 are available on the Intranet .
Information on meetin
Senate committee of the Hochschule Kaiserslautern
The university’s basic rules stipulate five faculties. The Senate includes: the President as chair, 10 representatives for the professors, 5 representatives for the students, 3 representatives for the academic and non-research employees.
Advisory members include the Deans, provided that they have n
SensTex - Thermal moisture sensor for application in thin, textile-like layers
The determination of moisture and temperature in thin textile-like layers is interesting for a wide range of applications. Especially for body-worn applications, the so-called wearables, a measurement method with the following characteristics is needed: • resista
SensTex - Thermal moisture sensor for application in thin, textile-like layers
The determination of moisture and temperature in thin textile-like layers is interesting for a wide range of applications. Especially for body-worn applications, the so-called wearables, a measurement method with the following characteristics is needed: • resistant
Following this characterization, the damaged volume is removed from the specimen, which is polished and then subjected to secondary loading on various test systems at test frequencies of 5, 60, 200 and 1000 Hz. In the HCF range, a direct comparison with the original undamaged specimens can thus be derived. In the VHCF range, possible deviations i
Following this characterization, the damaged volume is removed from the specimen, which is polished and then subjected to secondary loading on various test systems at test frequencies of 5, 60, 200 and 1000 Hz. In the HCF range, a direct comparison with the original undamaged specimens can thus be derived. In the VHCF range, possible deviations i
