Prof. Dr. rer. nat. Christian Schorr

Publications

  • Schorr, C.; Luschkova, M.; Dahmen, T.: Automatic detection of billets in rolling mills using convolutional neural networks with synthetic data,  In: International Conference on NDE 4.0, Berlin,  2022
  • Schorr, C.; Goodarzi, P.; Chen, F.; Dahmen, T.: Neuroscope - An explainable AI toolbox for semantic segmentation and classification of deep neural nets,  In: Applied Science, special issue on explainable AI,  Vol. 11,  Nr. 5,  DOI  10.3390/app11052199,  2021
  • Schorr, C.: Hybrid consistency and plausibility verification of product data according to the EU regulation on food information to consumers (FIC),  arXiv:2102.02665,  2021
  • Allweyer O., Schorr C., Mohr A., Krieger R.: Product Classification Using Partially Abbreviated Product Names, Brands and Dimensions,  In: Data Management Technologies and Applications. DATA 2020. Communications in Computer and Information Science,  Vol. 1446,  DOI  10.1007/978-3-030-83014-4_11,  2021
  • Harth, M.; Schorr, C.; Krieger, R.: A hierarchical multi-level product classification workbench for retail,  In: Learning, Knowledge, Data, Analytics Conference, Bonn,  2020
  • Schorr, C.: Machine Learning assisted Alcoholic Beverage Classification for Retail,  In: Proceedings of the Upper-Rhine Artificial Intelligence Symposium 2020,  S. 12-23,  2020
  • Allweyer, O.; Schorr, C.; Krieger, R.; Mohr, A.: Product classification based on partially abbreviated product names in retail,  In: 9th International Conference on Data Science, Technology and Applications (DATA), Paris, France,  2020
  • Fritsch, T.; Schorr, C.: CT-Reihenanalyse spätlatènezeitlicher, eiserner Dosen und Kapseln aus Rheinhessen und dem Hunsrück - Fertigungstechnische Details als Chance der Erkennung von Werkstätten?,,  In: Archäologie in Rheinhessen und Umgebung,  Vol. 13,  S. 39-69,  2020
  • Schorr, C.; Krieger, R.: A Reference Model for Product Data Profiling in Retail ERP Systems,  In: 8th International Conference on Data Science, Technology and Applications (DATA), Prague, Czech Republic,  2019
  • Vogelgesang, J.; Schorr, C.: Iterative Region-of-interest Reconstruction using Priori Information,  In: Sens Imaging,  Vol. 18,  Nr. 16,  DOI  10.1007/s11220-017-0165-8,  2017
  • Trampert, P.; Vogelgesang, J.; Schorr, C.; Maisl, M.; Bogachev, S.; Marniok, N. et al.: Spherically Symmetric Volume Elements as Basis Functions for Reconstructions in Computed Laminography,  In: Journal of X-Ray Science and Technology,  Vol. 25,  Nr. 4,  S. 533-546,  DOI  10.3233/XST-16230,  2017
  • Dörr, L.; Maisl, M.; Schorr, C.; Schuster, T.: Registration of a priori Information for Computed Laminography,  In: , NDT&E International,  Vol. 106,  S. 106-112,  DOI  10.22028/D291-28324,  2017
  • Vogelgesang, J.; Schorr, C.: A Semi-Discrete Landweber–Kaczmarz Method for Cone Beam Tomography and Laminography Exploiting Geometric Prior Information,  In: Sens Imaging,  Vol. 17,  Nr. 17,  DOI  10.1007/s11220-016-0142-7,  2017
  • Dörr, L.; Maisl, M.; Schorr, C.: Advanced computed laminography using a priori information,  In: Proceedings of the 19th World Conference on Non-Destructive Testing 2016, Munich,  2016
  • Maisl, M.; Scholl, H.; Schorr, C.; Seemann, R.: Reconstruction of fluid flows in porous media using geometric a priori information,  In: Review of Scientific Instruments,  Vol. 87,  Nr. 12,  DOI  10.1063/1.4971301,  2016
  • Fritsch, T.; Schorr, C.: Röntgenanalyse der Pyxis von Bierfeld, Gde. Nonnweiler, Flur “Vor dem Erker”, Fst. 5,  In: Bull. Soc. Préhist. Luxembourgeoise,  Vol. 36,  S. 219-224,  2015
  • Dörr, L.; Maisl, M.; Schorr, C.: Semi-automatische Registrierung von a priori Modellen und Messdaten für die Computertomographie und -laminographie,  In: Proceedings DACH-Jahrestagung 2015, Salzburg, Austria,  2015
  • Dörr, L.; Maisl, M.; Schorr, C.: Applying a priori Information to computed laminography,  In: Proceedings of the Digital Industrial Radiology and Computed Tomography (DIR 2015), Ghent, Belgium,  2015
HSKL

Prof. Dr. rer. nat. Christian Schorr

Faculties

Informatik und Mikrosystemtechnik

Consultations

Nach Vereinbarung

Campus

Zweibrücken

Room

H236