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2025
M. Wagner, J. Piela, B. H. Zacher and C. Schumann, "Voltage Overshoot Reduction for Bidirectional Switches in Current Source Inverters," PCIM Conference 2025; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, Nürnberg, Germany, 2025, pp. 1468-1474, DOI: 10.30420
2024
A. Hasnain, H. Heilmann, M. U. Anwar, B. Bufe and A. Tarasov, "Detection of Cellular Interaction with Small Peptides Immobilized on SPR Biosensors," 2024 IEEE BioSensors Conference (BioSensors), Cambridge, United Kingdom, 2024, pp. 1-4. https://doi.org/10.1109/BioSensors61405.2024.10712703.
Sreepada, Abhijit; Khasanov, Rasul; Elkre
2023
W. Zhang, L. Decker, T. Brigadski, B. Gundelsweiler and S. Urschel, "A Linear Magnetic Soft Actuator with Image-based Force Sensing for Mechanical Characterization of Soft Materials," 2023 IEEE International Conference on Robotics and Biomimetics (ROBIO), Koh Samui, Thailand, 2023, pp. 1-6, https://doi.org/10.1109/ROBIO58561.202
2022
S. Pagliano, D.E. Marschner, D. Maillard, N. Ehrmann, G. Stemme, S. Braun, L. Villanueva, F. Niklaus “Micro 3D printing of a functional MEMS accelerometer,” Microsyst Nanoeng, vol. 8, no. 1, p. 105, 2022. https://doi.org/10.1038/s41378-022-00440-9
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2021
I. Sachs, M. Fuhrmann, I. Verboven, I. Basak, W. Deferme, H. Möbius, Inkjet Printed Lenses with Adjustable Contact Angle to Improve the Light Out‐Coupling of Organic Light Emitting Diodes, Advanced Engineering Materials. (2021). https://doi.org/10.1002/adem.202100212.
T. Mankeekar, · Dirk Bähre, D. Durneata, T. Hall, R. Lilischkis,
2020
M. Fuhrmann, A. Krivcov, A. Musyanovych, R. Thoelen, H. Möbius, the role of nanoparticles on topographic cross-talk in electric force microscopy and magnetic force microscopy, Physica Status Solidi A: Applications and Materials Science. 217 (2020) 1900828. https://doi.org/https://doi.org/10.1002/pssa.201900828.
M.S. Filipiak, D. Vetter,
2019
Krivcov, A.; Ehrler, J.; Fuhrmann, M.; Junkers, T.; Möbius, H. Beilstein J. Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy. Nanotechnol. 2019, 10, 1056–1064. https://doi.org/10.3762/bjnano.10.106.
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